Scanning Probe Microscope Nanoeducator
A scanning probe microscope is used to investigate the micro and nanoscale structures that are difficult or impossible to investigate with the help of optical microscopy, on the surface of different materials with high resolution.
Linear measurement range up to 90 microns;
Range measuring along the axis of Z 8 microns; The resolution in the plane XY 30 nm; Z-axis resolution 10 nm. Maximum number of scan points 512x512